Modern interferometry for length metrology :exploring limits and novel techniques /

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"Version: 20181201"--Title page verso.Includes bibliographical references.1. Practical realisation of the length by interferometry??ogeneral principles and limitations -- 1.1. A short history of the metre and the present definition -- 1.2. Realisation of the length by direct measurement of the light travelling time (time-of-flight measurement) -- 1.3. The basic concept of length measurement by interferometry -- 1.4. Optical frequency standards -- 1.5. Types of length measuring interferometers -- 1.6. General requirements and limitations in length measurements by interferometry82. Large field imaging interferometry for the measurement of the length of bar shaped material measures -- 2.1. Introduction -- 2.2. Topography-based measurement of the interference phase and extraction of the fractional order of interference -- 2.3. Determination of the integer order of interference -- 2.4. Measurement of the air refractive index -- 2.5. Interferometer adjustment and limitations due to optical components and the light source -- 2.6. Effect of surface roughness and phase change on reflection -- 2.7. Wringing contact between a body and a platen -- 2.8. Double ended interferometry -- 2.9. PTB's ultra precision interferometer??odesign for special tasks -- 2.10. The importance of the temperature measurement -- 2.11. Primary gauge block calibrations performed today83. Fizeau interferometry for the sub-nm accurate realisation of sphere radii -- 3.1. A brief history -- 3.2. The measurement principle -- 3.3. Optical interference -- 3.4. Experimental implementation at PTB -- 3.5. Outlook84. Laser interferometry for high resolution metrology in space -- 4.1. Introduction -- 4.2. Interferometric distance and tilt metrology -- 4.3. Space-based gravitational wave detection -- 4.4. Mapping Earth's gravitational field using satellite-to-satellite tracking -- 4.5. Summary and outlook85. Interferometry in air with refractive index compensation -- 5.1. The index of refraction -- 5.2. Determining the intrinsic parameters -- 5.3. Dispersive intrinsic refractivity compensation -- 5.4. Air wavelength stabilisation -- 5.5. Conclusions86. Frequency comb based spectral interferometry and homodyne many-wavelength interferometry for distance measurements -- 6.1. Introduction to frequency comb lasers and their applications to dimensional metrology -- 6.2. Distance measurement based on cross-correlation -- 6.3. Evolution of cross-correlations at longer pulse propagation distances -- 6.4. Spectral interferometry -- 6.5. Mode-resolved homodyne interferometry -- 6.6. Recent developments and outlook87. Distance measurements using mode-locked pulse lasers -- 7.1. Introduction -- 7.2. Comb-referenced multi-wavelength interferometer -- 7.3. Comb-based dispersive interferometry -- 7.4. Time-of-flight measurement by pulse-to-pulse cross-correlation -- 7.5. Time-of-flight measurement by dual-comb interferometry -- 7.6. Summary and outlook88. Absolute distance measurement using frequency scanning interferometry -- 8.1. Introduction -- 8.2. Physical description of FSI interferometers -- 8.3. FSI analysis techniques -- 8.4. FSI hardware technology89. Picometre level displacement interferometry -- 9.1. Influences of the laser light source -- 9.2. Correction of the refractive index -- 9.3. Length-proportional error resulting for beam diffraction -- 9.4. Conclusion.3Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the fields of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units requires a measurement principle which establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and describes innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data and novel techniques enabling them to better apply and understand interferometry and length metrology.Also available in print.Mode of access: World Wide Web.System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.Modern Interferometry for Length Metrology: Exploring limits and novel techniques has been written by leading experts within the field of metrology and edited by Dr. Ren?e Sch?odel who is the head of The Department of Interferometry on Material Measures at the Physikalisch-Technische Bundesanstalt (PTB). Dr. Sch?odel is highly engaged in fields of optical interferometry and length metrology and has contributed significant findings and practical applications to this book along with his co-authors. Contributing their expert knowledge to the work are, Dr. Florian Pollinger, Dr. Arnold Nicolaus, Dr. Guido Bartl, Dr. Thilo Schuldt, Dr. Nandini Bhattacharya, Dr. Steven van den Berg, Professor Seung-Woo Kim, Dr. Yoon-Soo Jang, Professor Armin Reichhold, Dr. Birk Andreas and Dr. Christoph Weichert.Title from PDF title page (viewed on January 16, 2019).

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: .,

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1 online resource (various pagings) :illustrations (chiefly color).

Language

English

ISBN/ISSN

9780750315784

Classification

530.8

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-

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Subject(s)

SCIENCE / Physics / Optics & Light.
Length measurement.
Interferometry. 7
Applied physics.

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Statement of Responsibility

Ren?e Sch?odel (editor).

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