Full field optical metrology and applications /

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"Version: 20221201"--Title page verso.Includes bibliographical references.1. Foundations of optical interferometry -- 1.1. Light waves -- 1.2. Types of interferometers -- 1.3. Interference of light waves -- 1.4. Multiple wave interference -- 1.5. White-light interferometry -- 1.6. Holographic interferometry2. Coherence -- 2.1. Introduction : the background -- 2.2. Basic principles of coherence -- 2.3. Temporal coherence -- 2.4. Partial coherence -- 2.5. Spatial coherence3. Phase retrieval -- 3.1. Phase sampling evaluation -- 3.2. Modern methods for phase retrieval -- 3.3. Interference phase demodulation4. Laser speckle metrology -- 4.1. Basics for laser speckle metrology -- 4.2. Laser speckle measurements5. Moir?e interferometry -- 5.1. Introduction -- 5.2. Moir?e pattern formulation -- 5.3. Moir?e pattern alignment -- 5.4. Shape detection via the moir?e pattern6. Holography -- 6.1. Digital holographic interferometry7. Digital speckle pattern interferometry (DSPI) -- 7.1. Background -- 7.2. DSPI technique -- 7.3. The sensitivity vector, the displacement vector, and the optical phase difference -- 7.4. In-plane and out-of-plane sensitive set-ups -- 7.5. Phase-stepping interferometry -- 7.6. Vibration modes obtained with DSPI8. 3D digital holographic interferometry -- 8.1. Principle -- 8.2. Illuminating once at a time -- 8.3. Illuminating at the same time (simultaneously) -- 8.4. Strain measurement using DHI -- 8.5. Deformation in 3D measurements -- 8.6. Amplitude and phase calculation for harmonic excitation with pulsed object illumination : an example9. Digital holographic microscopy for surface profilometry -- 9.1. Introduction -- 9.2. Digital holographic microscopy -- 9.3. Optical phase unwrapping by multi-wavelength digital holographic microscopy -- 9.4. Digital holography using low coherence sources10. Contouring -- 10.1. Two points of object illumination -- 10.2. Two-wavelength contouring -- 10.3. Contouring from experimental data11. Optical coherence tomography -- 11.1. OCT configurations -- 11.2. Optical phase in spectral OCT -- 11.3. Examples of depth-resolved phase measurement12. Digital image correlation -- 12.1. A brief introduction to digital image correlation -- 12.2. Two-dimensional digital image correlation -- 12.3. Three-dimensional digital image correlation13. Speckle-noise reduction in optical techniques by non-local means methods -- 13.1. Introduction -- 13.2. Non-local means methods -- 13.3. Examples14. Overview of recent applications using DHI -- 14.1. Introduction -- 14.2. Basic applications of DHI15. A couple of trending applications related to holography -- 15.1. Electron holographic interferometry -- 15.2. Quantum holography.This book introduces non-contact optical techniques based on the speckle effect in more detail.Scientists and Engineers looking for a reference book giving detailed work on methods/techniques in full field speckle-based metrology.Also available in print.Mode of access: World Wide Web.System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.Fernando Mendoza Santoyo is an Emeritus Professor at Centro de Investigaciones en Optica-CIO, M?exico, where he was the founder of the Optical Metrology Division in 1991.Title from PDF title page (viewed on January 9, 2023).

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Publisher

: .,

Collation

1 online resource (various pagings) :illustrations (some color).

Language

English

ISBN/ISSN

9780750330275

Classification

681/.25

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-

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-

Edition

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Subject(s)

Optical physics.
SCIENCE / Physics / Optics & Light.
Optical measurements.
Metrology.

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Statement of Responsibility

Fernando Mendoza-Santoyo, Manuel De la Torre-Ibarra, Mar?ia del Socorro Hern?andez-Montes and Jorge Mauricio Flores Moreno.

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