Neutron and x-ray reflectometry :emerging phenomena at heterostructure interfaces /

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"Version: 20221201"--Title page verso.Includes bibliographical references.1. Introduction -- 1.1. Interface-driven properties using neutron/x-ray reflectometry -- 1.2. Emerging phenomena at interfaces using polarized neutron reflectometry -- 1.3. Thin-film growth mechanisms -- 1.4. Thin-film deposition techniques -- 1.5. Other complementary surface characterisation techniques2. Theory of neutron reflectometry -- 2.1. Introduction -- 2.2. Optical theory of reflection -- 2.3. Specular NR using unpolarized neutrons -- 2.4. Specular polarized neutron reflectometry -- 2.5. Coherence area and resolution in neutron reflectometry experiments -- 2.6. Off-specular (or diffuse) neutron scattering -- 2.7. Polarized diffuse neutron scattering -- 2.8. Data analysis for reflectometry3. Understanding emerging phenomena at interfaces using specular neutron and x-ray reflectometry -- 3.1. Emerging phenomena at interfaces and characterization -- 3.2. Ferromagnetic metal/semiconductor heterostructures -- 3.3. Interlayer exchange coupling : ferromagnetic metal/nonmagnetic metal heterostructures -- 3.4. Multilayer with noncolinear and chiral magnetic structures -- 3.5. Exchange bias : interface magnetization -- 3.6. Proximity effect and coupling in complex oxide magnetic and superconducting heterostructures -- 3.7. Strain-driven interfacial magnetism in complex oxide heterostructures -- 3.8. Emergent and interface-induced magnetism at complex oxide interfaces -- 3.9. Superdense and nonmagnetic Co phase at interfaces -- 3.10. Tracking interdiffusion and self-diffusion kinetics at interfaces -- 3.11. Proximity-driven magnetic order in topological insulators and interface magnetization in Weyl semimetal -- 3.12. Control of local magnetization in isovalent oxide heterostructures by interface engineering4. Correlation of interface morphology and magnetism in heterostructures : off-specular (diffuse) scattering -- 4.1. Off-specular (diffuse) scattering -- 4.2. Off-specular (diffuse) x-ray scattering -- 4.3. Off-specular (diffuse) neutron scattering -- 5. Summary and outlook.This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.Research students and institutions that are carrying out work in thin film structure and magnetism.Also available in print.Mode of access: World Wide Web.System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.Saibal Basu carried out research in the field of neutron scattering and neutron instrumentation at Dhruva reactor in India for more than three decades. Surendra Singh is a scientist at the Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai.Title from PDF title page (viewed on January 9, 2023).

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Call Number

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Publisher

: .,

Collation

1 online resource (various pagings) :illustrations (some color).

Language

English

ISBN/ISSN

9780750346955

Classification

621.36028/4

Content Type

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Media Type

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Carrier Type

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Edition

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Subject(s)

Atomic & molecular physics.
SCIENCE / Physics / Magnetism.
X-rays
Thin films
Neutrons
Reflection (Optics)

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Statement of Responsibility

Saibal Basu, Surendra Singh.

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