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Found 1 from your keywords: subject="Spectrum analysis, sp...
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Secondary ion mass spectrometry and its application to materials science /
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Institute of Physics (Great Britain),Fearn, Sarah,

"Version: 20250801"--Title page verso.Revised edition of: An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science.Includes bibliographical references.1. Introduction -- 2. Secondary ion generation, analysis, and detection -- 2.1. Secondary ion generation -- 2.2. Filtering, focussing, and steering -- 2.3. Sputtering and ionisation -- …

Edition
Second edition.
ISBN/ISSN
9780750333313
Collation
1 online resource (various pagings) :illustrations (some color).
Series Title
-
Call Number
-